Atomic Force MicroscopyAtomic force microscopy is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution. This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry illustrate the different capabilities of the technique. |
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addition advantage AFM images allows amplitude analysis applied approach artefacts atomic axis calibration cantilever carried cause cells Chapter common commonly constant contact mode contamination curves deflection described direction distance effect electronics example experiments filtering flat force frequency friction function geometry give height illustrated important interaction laser lateral lead Left less levelling lever liquid materials means measured mechanical method microscope mode molecules motion move nanoparticles noise normal obtained operation optical oscillation parameters particles particularly phase piezoelectric position possible probe problems procedure properties protein range reason resolution roughness sample sample surface scanner scanning sensitive sensor shape shown in Figure shows signal silicon simple stage step structure studies substrate surface technique topography types typically usually values vibration voltage widely