Transmission Electron Microscopy: A Textbook for Materials Science
Springer Science & Business Media, Mar 9, 2013 - Science - 729 pages
Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It is also essential that suitable texts be available are, of course, based in physics, so aspiring materials sci for the preparation of the students and researchers who must entists would be well advised to have prior exposure to, for carry out electron microscopy properly and quantitatively.
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and the Diffraction Pattern
How to See Electrons
Pumps and Holders
Diffraction from Small Volumes
ley Moodie and their coworkers principally at Melbourne and Arizona State University ASU in a series
Other Imaging Techniques
Electron EnergyLoss Spectrometers
Acknowledgements for Figures
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amplitude analysis angle astigmatism atoms Bloch waves Bragg Bragg angle Bragg condition bremsstrahlung C2 aperture calculate CBED pattern Chapter contrast cross section crystal defects define detector determine DF image diffracted beam diffraction pattern direct beam discuss disk dislocations dispersion surface edge EELS effect elastic scattering elec electron beam Electron Microscopy energy energy-loss equation Ewald sphere experimental factor film foil fringes function give hké HOLZ lines HRTEM incident beam intensity interface ionization Kikuchi lines lenses magnification materials microanalysis º º objective aperture objective lens optic axis parallel parameter peak phase plane plasmon point group reciprocal lattice reciprocal space reflections region relrod rotation SAD pattern scattered electrons screen semiangle shown in Figure simulation space spectrometer spectrum spots STEM image structure symmetry technique thickness thin specimen tilt tion trons unit cell vector voltage wave vector we’ll X-ray XEDS ZOLZ