Transmission Electron Microscopy and Diffractometry of Materials

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Springer Science & Business Media, Oct 13, 2012 - Science - 764 pages
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.
 

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Contents

Diffraction and the XRay Powder Diffractometer
1
The TEM and Its Optics
59
Neutron Scattering
116
Scattering
145
Inelastic Electron Scattering and Spectroscopy
181
Diffraction from Crystals
237
Electron Diffraction and Crystallography
289
Diffraction Contrast in TEM Images
349
Patterson Functions and Diffuse Scattering
463
HighResolution TEM Imaging
521
HighResolution STEM and Related Imaging Techniques
587
Dynamical Theory
616
Appendix
681
Bibliography
734
Index
747
Copyright

Diffraction Lineshapes
429

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About the author (2012)

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on Transmission Electron Microscopy and Diffractometry of Materials.

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.

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