In-situ Materials Characterization: Across Spatial and Temporal Scales

Front Cover
Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken
Springer Science & Business Media, Apr 1, 2014 - Science - 256 pages
The behavior of nanoscale materials can change rapidly with time either because the environment changes rapidly or because the influence of the environment propagates quickly across the intrinsically small dimensions of nanoscale materials. Extremely fast time resolution studies using X-rays, electrons and neutrons are of very high interest to many researchers and is a fast-evolving and interesting field for the study of dynamic processes. Therefore, in situ structural characterization and measurements of structure-property relationships covering several decades of length and time scales (from atoms to millimeters and femtoseconds to hours) with high spatial and temporal resolutions are crucially important to understand the synthesis and behavior of multidimensional materials. The techniques described in this book will permit access to the real-time dynamics of materials, surface processes and chemical and biological reactions at various time scales. This book provides an interdisciplinary reference for research using in situ techniques to capture the real-time structural and property responses of materials to surrounding fields using electron, optical and x-ray microscopies (e.g. scanning, transmission and low-energy electron microscopy and scanning probe microscopy) or in the scattering realm with x-ray, neutron and electron diffraction.
 

What people are saying - Write a review

We haven't found any reviews in the usual places.

Contents

1 Insitu Characterization of Molecular Processes in Liquids by Ultrafast Xray Absorption Spectroscopy
1
2 Insitu Xray Diffraction at Synchrotrons and FreeElectron Laser Sources
39
3 Insitu Transmission Electron Microscopy
59
4 Ultrafast Transmission Electron Microscopy and Electron Diffraction
110
5 Insitu and Kinetic Studies Using Neutrons
147
6 Scanning Tunneling Microscopy at Elevated Pressure
180
7 Detectors for Electron and Xray Scattering and Imaging Experiments
207
Index
251
Copyright

Other editions - View all

Common terms and phrases