## Transmission Electron Microscopy and Diffractometry of MaterialsAims and Scope of the Book This textbook was written for advanced un dergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials characterization research using TEM and XRD. There are, of course, many specialties that have attained a higher level of sophistication than presented here. The content of this book has been chosen in part to provide the background needed for a transition to these research specialties, or to other techniques such as neutron diffractometry. Although the book includes many practical details and examples, it does not cover some topics important for laboratory work. Perhaps the most obvious is the omission of specimen preparation methods for TEM. Beneath the details of principle and practice lies a larger goal of unifying the concepts common to both TEM and XRD. Coherence and wave interfer ence are conceptually similar for both x-ray waves and electron wavefunctions. |

### What people are saying - Write a review

We haven't found any reviews in the usual places.

### Contents

1 | |

5 | |

The TEM and its Optics 63 | 62 |

Further Reading | 114 |

Scattering | 123 |

Further Reading | 164 |

Inelastic Electron Scattering and Spectroscopy | 167 |

Further Reading | 219 |

Electron Diffraction and Crystallography | 275 |

Problems | 332 |

Diffraction Contrast in TEM Images 339 | 338 |

Further Reading | 415 |

Patterson Functions and Diffuse Scattering | 467 |

Bibliography | 661 |

In section titles the asterisk denotes a more specialized topic | 669 |

A Appendix | 675 |

### Other editions - View all

Transmission Electron Microscopy and Diffractometry of Materials Brent Fultz,James Howe Limited preview - 2013 |

### Common terms and phrases

absorption alloy amplitude angle approximation atomic form factor Bloch wave Bragg Bragg angle Bragg's law bremsstrahlung calculate coherent column crystal crystallites defocus density detector DF image diffracted beam diffracted intensity diffraction contrast diffraction pattern diffraction spots disk dislocation distance dynamical edge EELS electron beam electron diffraction Electron Microscopy electron scattering energy loss Equation Ewald sphere example forward beam Fourier transform fringes high-energy electron HRTEM incident beam inelastic scattering integral interface Kikuchi lines lattice parameter length material measured microscope neutron objective aperture objective lens obtained optic axis orientation particle Patterson function peaks phase-amplitude diagram photon plasmon position potential provides radiation rays reciprocal lattice sample Sect shape factor shown in Fig shows space specimen spectrum spherical spherical aberration stacking fault stereographic projection structure factor symmetry thickness tilt tion Transmission Electron Microscopy typically unit cell vector wavefunction wavelength wavelets wavevector ZOLZ zone axis