Transmission Electron Microscopy and Diffractometry of Materials

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Springer Science & Business Media, Nov 21, 2013 - Science - 748 pages
Aims and Scope of the Book This textbook was written for advanced un dergraduate students and beginning graduate students with backgrounds in physical science. Its goal is to acquaint them, as quickly as possible, with the central concepts and some details of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The topics in this book are developed to a level appropriate for most modern materials characterization research using TEM and XRD. There are, of course, many specialties that have attained a higher level of sophistication than presented here. The content of this book has been chosen in part to provide the background needed for a transition to these research specialties, or to other techniques such as neutron diffractometry. Although the book includes many practical details and examples, it does not cover some topics important for laboratory work. Perhaps the most obvious is the omission of specimen preparation methods for TEM. Beneath the details of principle and practice lies a larger goal of unifying the concepts common to both TEM and XRD. Coherence and wave interfer ence are conceptually similar for both x-ray waves and electron wavefunctions.
 

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Contents

Diffraction and the XRay Powder Diffractometer
1
Index 735
5
The TEM and its Optics 63
62
Further Reading
114
Scattering
123
Further Reading
164
Inelastic Electron Scattering and Spectroscopy
167
Further Reading
219
Electron Diffraction and Crystallography
275
Problems
332
Diffraction Contrast in TEM Images 339
338
Further Reading
415
Patterson Functions and Diffuse Scattering
467
Bibliography
661
In section titles the asterisk denotes a more specialized topic
669
A Appendix
675

Diffraction from Crystals
225
Further Reading
268

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