Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling MicroscopyThis book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope. The chapters on the scanning probe techniques are complemented by the chapters on fundamentals and important technical aspects. This textbook is primarily aimed at graduate students from physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field. |
Contents
| 1 | |
| 12 | |
| 13 | |
3 Technical Aspects of Scanning Probe Microscopy | 31 |
4 Scanning Probe Microscopy Designs | 65 |
5 Electronics for Scanning Probe Microscopy | 77 |
6 LockIn Technique | 101 |
7 Data Representation and Image Processing | 107 |
16 Mapping of Mechanical Properties Using ForceDistance Curves | 223 |
17 Frequency Modulation FM Mode in Dynamic Atomic Force MicroscopyNoncontact Atomic Force Microscopy | 229 |
18 Noise in Atomic Force Microscopy | 255 |
19 Quartz Sensors in Atomic Force Microscopy | 269 |
Part III
Scanning Tunneling Microscopy andSpectroscopy | 278 |
20 Scanning Tunneling Microscopy | 279 |
21 Scanning Tunneling Spectroscopy STS | 309 |
22 Vibrational Spectroscopy with the STM | 335 |
8 Artifacts in SPM | 115 |
9 Work Function Contact Potential and Kelvin Probe Scanning Force Microscopy | 123 |
10 Surface States | 135 |
Part IIAtomic Force Microscopy AFM | 144 |
11 Forces Between Tip and Sample | 145 |
12 Technical Aspects of Atomic Force Microscopy AFM | 157 |
13 Static Atomic Force Microscopy | 177 |
14 Amplitude Modulation AM Mode in Dynamic Atomic Force Microscopy | 187 |
15 Intermittent Contact ModeTapping Mode | 205 |
23 Spectroscopy and Imaging of Surface States | 341 |
24 Building Nanostructures Atom by Atom | 349 |
Appendix AHorizontal Piezo Constant for a TubePiezo Element | 358 |
Appendix BFermis Golden Rule and BardeensMatrix Elements | 363 |
Appendix CFrequency Noise in FM Detection | 371 |
| 374 | |
| 377 | |
Other editions - View all
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling ... Bert Voigtländer No preview available - 2015 |
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling ... Bert Voigtländer No preview available - 2016 |
Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling ... Bert Voigtländer No preview available - 2015 |
Common terms and phrases
actuator applied approximation atomic force microscopy bandwidth beam bias voltage cantilever oscillation considered contact mode controller corresponding crystal damping dependence differential conductance dipole dissipative driving frequency electric field electron energy excitation exponentially feedback loop Fermi level FM detection fmod force gradient force-distance curve free cantilever frequency shift harmonic oscillator input integral LDOS leads lock-in lock-in amplifier measured modulation molecule noise density obtained operational amplifier oscillation amplitude output phase shift photodiode piezo constant piezo element piezo tube piezoelectric effect position potential proportional Q-factor regime repulsive resonance curve resonance frequency Scanning Probe Microscopy scanning tunneling scanning tunneling microscopy Schematic Schrödinger equation setpoint shown in Fig slider slope snap-to-contact solution spring constant static surface tapping mode thermal noise tip and sample tip-sample distance tip-sample force tip-sample interaction transfer function transmission factor tunneling current vacuum vibration wave function zero