Modern Developments and Applications in Microbeam Analysis

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Glyn Love, W.A.Patrick Nicholson, Aldo Armigliato
Springer Science & Business Media, Dec 6, 2012 - Technology & Engineering - 392 pages
This supplement of Mikrochimica Acta contains selected papers from the Fifth Workshop of the European Microbeam Analysis Society (EMAS) on "Modern Developments and Applications in Microbeam Analysis" which th th took place from the 11 to 15 May 1997 in Torquay (UK). EMAS was founded in 1986 by scientists from many European countries in order to stimulate research in microbe am analysis and into its development and application. The society now has over 350 members from more than 20 countries. An important EMAS activity is the organisation of biennial workshops which focus upon the current status and developing trends in microanalytical techniques. For this meeting EMAS chose to invite speakers on the following subjects: Standardless analysis, EPMA techniques for quantitative near-surface analysis and depth profiling, Matrix corrections in Auger electron and X-ray photon spectroscopy, X-ray analysis and imaging using low voltage beams, Scanning probe and near field microscopies, EPMA of frozen biological bulk samples, Environmen tal SEM and X-ray microanalysis of biological materials, Quantitative elemental mapping of X-ray radiographs by factorial correspondence, X-ray spectrum processing and multivariate analysis, Thin film analysis and chemical mapping in the analytical electron microscope, Wavelength dispersive X-ray spectroscopy, High resolution non dispersive X-ray spectroscopy with state-of-the-art silicon detectors and Recent developments in instrumentation for X-ray analysis. These invited lectures were given by eminent scientists from Europe, the USA, and Australia In addition to the introductory lectures there were poster sessions at which some 110 posters were on display.
 

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Contents

Recent Developments in Instrumentation for XRay Microanalysis
2
Efficiency Calibration of a SiLi Detector by EPMA
21
XRay Spectrum Processing and Multivariate Analysis
37
On the Spatial Resolution in Analytical Electron Microscopy
59
Analytical Electron Microscopy of Diffusional Interfaces in an Al22 at 9 Zn Alloy
74
CryoElectron Spectroscopic Imaging Electron EnergyLoss Spectroscopy and EnergyDispersive
87
Surface Characterisation and Modification of YBCO Thin Films by
101
Theory and Evaluation
123
Determination of Chemical and Phase Composition of FlyAshes by Combined EPMA and XRD Methods
206
Compositional XRay Maps of Metamorphic and Magmatic Minerals
226
Electron Microprobe Determination of Minor and Trace Concentrations of Gold and Platinum Group
247
Potassium Migration in Silica Glass During Electron Beam Irradiation
268
Environmental SEM and XRay Microanalysis of Biological Materials
283
Effects of ElectronBeamGas Interactions on XRay Microanalysis in the Variable Pressure
295
A New Technique for Standardless Analysis by EPMATWIX
317
Monte Carlo Simulations of Edge Artefacts in MULSAM Images
333

Experiment
133
Quantitative EDS Analysis of SiO2Al2O3TiO2 Multilayer Films
149
H Films
162
Analysis of Thin Films with Slightly Rough Boundaries
177
EPMA of Melted UO Fuel Rods from the PhebusFP Reactor Accident Experiment
191
A Rapid Comparison of Matrix Corrections in AES and XPS by Means of Computer Programs
351
Fractals and BaTiO3Ceramic Microstructure Analysis
364
The Standards Measurements and Testing Programme SMT the European Support to Standardisation
387
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