The Dynamics of the Computer Industry: Modeling the Supply of Workstations and their ComponentsComputers communicate globally via satellite or fiber optic links, wide area networks share resources thousands of miles away, and the average home can have the capacity of access information at the push of a button - the digital information age has arrived! Several technologies have made this computer age possible, helped it grow, and affected its dynamics over time. This book addresses the problem of formulating a model that interrelates the factors that drive the supply of these technologies over time to the attributes of the computers that are manufactured from them. |
Contents
Model Behavior and Sensitivity Results | 4 |
1 | 55 |
ཙཚ | 109 |
Components Physical Characteristics Trends | 145 |
Conclusions and Suggestions for Future Research | 188 |
Other editions - View all
The Dynamics of the Computer Industry: Modeling the Supply of Workstations ... Walid Rachid Touma No preview available - 2012 |
The Dynamics of the Computer Industry: Modeling the Supply of Workstations ... Walid Rachid Touma No preview available - 2012 |
Common terms and phrases
19-inch color CRT actual data actual market data areal density average die testing bandwidth bit cell bit cell length CISC CPUs cm² color CRT display computer system configuration cost per megabyte CPU speed critical masks CRT's data rate defects per unit developed die area disk surface DRAM capacity DRAM price electron beams equation expressed mathematically feature size Figure floating point unit head-actuator setup width hole pitch IEEE increase interface magnetic hard disk magnetic storage main memory manufacturing megabyte of DRAMs megaHertz megapixel memory management unit metal shadow mask microcontroller microns microprocessors MIPS MIPS rating model results MOSFET number of critical number of disks number of instructions number of pixels number of silicon percent performance phosphors pixels per inch presented price per megabyte processor production Relational diagram resolution results and actual RISC screen semiconductor silicon wafer defects simulation storage system subsection technology-driving trends tion track pitch transistor workstation assembly yield